X-ray ultramicroscopy using integrated sample cells

Dachao Gao, Stephen W. Wilkins, David J. Parry, Tim E. Gureyev, Peter R. Miller, Eric Hanssen

Research output: Contribution to journalArticleResearchpeer-review

5 Citations (Scopus)


The X-ray ultramicroscope (XuM), based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. The right-angle-type integrated sample cells described here expand the capabilities of the XuM technique. The integrated sample cell combines a target, a spacer, a sample chamber, and an exit window in one physical unit, thereby simplifying the instrumentation and providing increased mechanical stability. The XuM imaging results presented here, obtained using such right-angle integrated sample cells, clearly demonstrate the ability to characterize very small features in objects, down to of order 100nm, including their use for dry, wet and even liquid samples.

Original languageEnglish
Pages (from-to)7889-7894
Number of pages6
JournalOptics Express
Issue number17
Publication statusPublished - 1 Jan 2006
Externally publishedYes

Cite this