X-ray phase contrast microscopy at 300 nm resolution with laboratory sources

Daniele Pelliccia, A Sorrentino, Inna Bukreeva, Alessia Cedola, Fernando Scarinci, Mihaela Ilie, Anna Maria Gerardino, Michela Fratini, Stefano Lagomarsino

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    We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.
    Original languageEnglish
    Pages (from-to)15998 - 16004
    Number of pages7
    JournalOptics Express
    Issue number15
    Publication statusPublished - 2010

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