Abstract
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups.
Original language | English |
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Pages (from-to) | 15998 - 16004 |
Number of pages | 7 |
Journal | Optics Express |
Volume | 18 |
Issue number | 15 |
DOIs | |
Publication status | Published - 2010 |