X-ray diffraction profiling of metal-metal interfaces at the nanoscale

Aliaksandr Darahanau, Andrei Yurievich Nikulin, Rouben Dilanian, Barrington Charles Muddle

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Several samples containing interfaces between dissimilar metals were examined using diffraction of synchrotron radiation. The complex refractive index profile in the vicinity of the interface for each sample was reconstructed with spatial resolution of about 40 nm by the phase retrieval x-ray diffractometry technique. A series of computer simulations related to the analysis of various configurations of interfaces between dissimilar materials were performed. A practical algorithm of experimental data collection for a detailed examination of internal interfaces was suggested. An estimation of the minimal size of the interface structure modulations, which can be analyzed by the phase retrieval x-ray diffractometry technique, was suggested from the results of computer simulations. It was shown that interface modulations of about 50-100 nm in bimetals can be readily reconstructed by the technique.
Original languageEnglish
Pages (from-to)075416-1 - 075416-11
Number of pages11
JournalPhysical Review B
Issue number7
Publication statusPublished - 2007

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