X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry

Andrei Yurievich Nikulin; Ron Steinfeld

doi:10.1016/j.tsf.2004.02.040

X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry

Andrei Yurievich Nikulin, Ron Steinfeld

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	28 - 35
Number of pages	8
Journal	Thin Solid Films
Volume	467
Issue number	1-Feb
DOIs	https://doi.org/10.1016/j.tsf.2004.02.040
Publication status	Published - 2004

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10.1016/j.tsf.2004.02.040

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title = "X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry",

author = "Nikulin, \{Andrei Yurievich\} and Ron Steinfeld",

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volume = "467",

pages = "28 -- 35",

journal = "Thin Solid Films",

issn = "0040-6090",

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X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry. / Nikulin, Andrei Yurievich; Steinfeld, Ron.
In: Thin Solid Films, Vol. 467, No. 1-Feb, 2004, p. 28 - 35.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry

AU - Nikulin, Andrei Yurievich

AU - Steinfeld, Ron

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4444317999

U2 - 10.1016/j.tsf.2004.02.040

DO - 10.1016/j.tsf.2004.02.040

M3 - Article

SN - 0040-6090

VL - 467

SP - 28

EP - 35

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-Feb

ER -

X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry

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