X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry

Andrei Yurievich Nikulin, Ron Steinfeld

    Research output: Contribution to journalArticleResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)28 - 35
    Number of pages8
    JournalThin Solid Films
    Volume467
    Issue number1-Feb
    DOIs
    Publication statusPublished - 2004

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