Original language | English |
---|---|
Pages (from-to) | 28 - 35 |
Number of pages | 8 |
Journal | Thin Solid Films |
Volume | 467 |
Issue number | 1-Feb |
DOIs | |
Publication status | Published - 2004 |
X-ray Bragg diffraction profiles from unstrained layered single-crystal structures: theoretical considerations, simulation and reconstruction using phase-retrieval X-ray diffractometry
Andrei Yurievich Nikulin, Ron Steinfeld
Research output: Contribution to journal › Article › Research › peer-review
2
Citations
(Scopus)