White-light bias external quantum efficiency measurements of standard and inverted P3HT: PCBM photovoltaic cells

Thomas J K Brenner; Yana Vaynzof; Zhe Li; Dinesh Kabra; Richard H Friend; Christopher Robert McNeill

doi:10.1088/0022-3727/45/41/415101

White-light bias external quantum efficiency measurements of standard and inverted P3HT: PCBM photovoltaic cells

Thomas J K Brenner, Yana Vaynzof, Zhe Li, Dinesh Kabra, Richard H Friend, Christopher Robert McNeill

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

28 Citations (Scopus)

Original language	English
Pages (from-to)	1 - 10
Number of pages	10
Journal	Journal of Physics D: Applied Physics
Volume	45
Issue number	41
DOIs	https://doi.org/10.1088/0022-3727/45/41/415101
Publication status	Published - 2012

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10.1088/0022-3727/45/41/415101

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title = "White-light bias external quantum efficiency measurements of standard and inverted P3HT: PCBM photovoltaic cells",

author = "Brenner, {Thomas J K} and Yana Vaynzof and Zhe Li and Dinesh Kabra and Friend, {Richard H} and McNeill, {Christopher Robert}",

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T1 - White-light bias external quantum efficiency measurements of standard and inverted P3HT: PCBM photovoltaic cells

AU - Brenner, Thomas J K

AU - Vaynzof, Yana

AU - Li, Zhe

AU - Kabra, Dinesh

AU - Friend, Richard H

AU - McNeill, Christopher Robert

PY - 2012

Y1 - 2012

UR - http://iopscience.iop.org/0022-3727/45/41/415101

U2 - 10.1088/0022-3727/45/41/415101

DO - 10.1088/0022-3727/45/41/415101

M3 - Article

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VL - 45

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JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 41

ER -

White-light bias external quantum efficiency measurements of standard and inverted P3HT: PCBM photovoltaic cells

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