Wettability and compositional analysis of hydroxyapatite films modified by low and high energy ion irradiation

A. R. Ananda Sagari, Paavo Rahkila, Markku Väisänen, Roope Lehto, Timo Sajavaara, Sergey Gorelick, Mikko Laitinen, Somjai Sangyuenyongpipat, Jussi Timonen, Sulin Cheng, Harry J. Whitlow

Research output: Contribution to journalArticleResearchpeer-review

13 Citations (Scopus)


Hydroxyapatite-like thin films on silicon substrate were deposited using atomic layer deposition and were subjected to irradiation with Ar ions accelerated through 0.6-1.2 kV as well as 2 MeV 16O+ ions. After low energy Ar irradiation a significant reduction in contact angle was observed. However, the Ca/P atomic ratio remained unchanged. No reduction in contact angle was seen for high energy 16O+ irradiation. Atomic force microscopy showed the enhancement of floral-like pattern after low energy Ar bombardment while high energy oxygen irradiation lead to raised islands on as-deposited films.

Original languageEnglish
Pages (from-to)2515-2519
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number10
Publication statusPublished - 1 May 2008
Externally publishedYes


  • AFM
  • Hydroxyapatite
  • Irradiation
  • Osteoblast
  • RBS
  • Wettability

Cite this