Welcome from the ESEM 2017 general chair and program co-chairs

Ayse Bener; Burak Turhan; Stefan Biffl

doi:10.1109/ESEM.2017.5

Welcome from the ESEM 2017 general chair and program co-chairs

Ayse Bener, Burak Turhan, Stefan Biffl

Department of Software Systems & Cybersecurity

Research output: Chapter in Book/Report/Conference proceeding › Foreword / Postscript › Other › peer-review

Original language	English
Title of host publication	11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement
Subtitle of host publication	9-10 November 2017 Markham, Ontario, Canada
Editors	Burak Turhan , Stefan Biffl
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	xii
ISBN (Electronic)	9781509040391
DOIs	https://doi.org/10.1109/ESEM.2017.5
Publication status	Published - 2017
Event	International Symposium on Empirical Software Engineering and Measurement 2017 - Toronto, Canada Duration: 9 Nov 2017 → 10 Nov 2017 Conference number: 11th http://www.scs.ryerson.ca/eseiw2017/ESEM/

Publication series

Name	International Symposium on Empirical Software Engineering and Measurement
ISSN (Print)	1949-3770

Conference

Conference	International Symposium on Empirical Software Engineering and Measurement 2017
Abbreviated title	ESEM 2017
Country/Territory	Canada
City	Toronto
Period	9/11/17 → 10/11/17
Internet address	http://www.scs.ryerson.ca/eseiw2017/ESEM/

Access to Document

10.1109/ESEM.2017.5

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Bener, A., Turhan, B., & Biffl, S. (2017). Welcome from the ESEM 2017 general chair and program co-chairs. In B. Turhan , & S. Biffl (Eds.), 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada (pp. xii). (International Symposium on Empirical Software Engineering and Measurement). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ESEM.2017.5

Bener, Ayse ; Turhan, Burak ; Biffl, Stefan. / Welcome from the ESEM 2017 general chair and program co-chairs. 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. editor / Burak Turhan ; Stefan Biffl. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2017. pp. xii (International Symposium on Empirical Software Engineering and Measurement).

@inbook{46c1be8fdf8a43878f883b7a3e4b39e0,

title = "Welcome from the ESEM 2017 general chair and program co-chairs",

author = "Ayse Bener and Burak Turhan and Stefan Biffl",

year = "2017",

doi = "10.1109/ESEM.2017.5",

language = "English",

series = "International Symposium on Empirical Software Engineering and Measurement",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

pages = "xii",

editor = "\{Turhan \}, \{Burak \} and Biffl, \{Stefan \}",

booktitle = "11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement",

address = "United States of America",

note = "International Symposium on Empirical Software Engineering and Measurement 2017, ESEM 2017 ; Conference date: 09-11-2017 Through 10-11-2017",

url = "http://www.scs.ryerson.ca/eseiw2017/ESEM/",

}

Bener, A, Turhan, B & Biffl, S 2017, Welcome from the ESEM 2017 general chair and program co-chairs. in B Turhan & S Biffl (eds), 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. International Symposium on Empirical Software Engineering and Measurement, IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. xii, International Symposium on Empirical Software Engineering and Measurement 2017, Toronto, Ontario, Canada, 9/11/17. https://doi.org/10.1109/ESEM.2017.5

Welcome from the ESEM 2017 general chair and program co-chairs. / Bener, Ayse; Turhan, Burak; Biffl, Stefan.
11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. ed. / Burak Turhan ; Stefan Biffl. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 2017. p. xii (International Symposium on Empirical Software Engineering and Measurement).

Research output: Chapter in Book/Report/Conference proceeding › Foreword / Postscript › Other › peer-review

TY - CHAP

T1 - Welcome from the ESEM 2017 general chair and program co-chairs

AU - Bener, Ayse

AU - Turhan, Burak

AU - Biffl, Stefan

N1 - Conference code: 11th

PY - 2017

Y1 - 2017

UR - https://www.scopus.com/pages/publications/85042375439

U2 - 10.1109/ESEM.2017.5

DO - 10.1109/ESEM.2017.5

M3 - Foreword / Postscript

AN - SCOPUS:85042375439

T3 - International Symposium on Empirical Software Engineering and Measurement

SP - xii

BT - 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement

A2 - Turhan , Burak

A2 - Biffl, Stefan

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway NJ USA

T2 - International Symposium on Empirical Software Engineering and Measurement 2017

Y2 - 9 November 2017 through 10 November 2017

ER -

Bener A, Turhan B, Biffl S. Welcome from the ESEM 2017 general chair and program co-chairs. In Turhan B, Biffl S, editors, 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2017. p. xii. (International Symposium on Empirical Software Engineering and Measurement). doi: 10.1109/ESEM.2017.5

Welcome from the ESEM 2017 general chair and program co-chairs

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