Welcome from the ESEM 2017 general chair and program co-chairs

Ayse Bener, Burak Turhan, Stefan Biffl

Research output: Chapter in Book/Report/Conference proceedingForeword / PostscriptOtherpeer-review

LanguageEnglish
Title of host publication11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement
Subtitle of host publication9-10 November 2017 Markham, Ontario, Canada
EditorsBurak Turhan , Stefan Biffl
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pagesxii
ISBN (Electronic)9781509040391
DOIs
Publication statusPublished - 2017
EventInternational Symposium on Empirical Software Engineering and Measurement 2017 - Toronto, Canada
Duration: 9 Nov 201710 Nov 2017
Conference number: 11th
http://www.scs.ryerson.ca/eseiw2017/ESEM/

Publication series

NameInternational Symposium on Empirical Software Engineering and Measurement
ISSN (Print)1949-3770

Conference

ConferenceInternational Symposium on Empirical Software Engineering and Measurement 2017
Abbreviated titleESEM 2017
CountryCanada
CityToronto
Period9/11/1710/11/17
Internet address

Cite this

Bener, A., Turhan, B., & Biffl, S. (2017). Welcome from the ESEM 2017 general chair and program co-chairs. In B. Turhan , & S. Biffl (Eds.), 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada (pp. xii). (International Symposium on Empirical Software Engineering and Measurement). Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ESEM.2017.5
Bener, Ayse ; Turhan, Burak ; Biffl, Stefan. / Welcome from the ESEM 2017 general chair and program co-chairs. 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. editor / Burak Turhan ; Stefan Biffl. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2017. pp. xii (International Symposium on Empirical Software Engineering and Measurement).
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Bener, A, Turhan, B & Biffl, S 2017, Welcome from the ESEM 2017 general chair and program co-chairs. in B Turhan & S Biffl (eds), 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. International Symposium on Empirical Software Engineering and Measurement, IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. xii, International Symposium on Empirical Software Engineering and Measurement 2017, Toronto, Canada, 9/11/17. https://doi.org/10.1109/ESEM.2017.5

Welcome from the ESEM 2017 general chair and program co-chairs. / Bener, Ayse; Turhan, Burak; Biffl, Stefan.

11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. ed. / Burak Turhan ; Stefan Biffl. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2017. p. xii (International Symposium on Empirical Software Engineering and Measurement).

Research output: Chapter in Book/Report/Conference proceedingForeword / PostscriptOtherpeer-review

TY - CHAP

T1 - Welcome from the ESEM 2017 general chair and program co-chairs

AU - Bener, Ayse

AU - Turhan, Burak

AU - Biffl, Stefan

PY - 2017

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DO - 10.1109/ESEM.2017.5

M3 - Foreword / Postscript

T3 - International Symposium on Empirical Software Engineering and Measurement

SP - xii

BT - 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement

A2 - Turhan , Burak

A2 - Biffl, Stefan

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway NJ USA

ER -

Bener A, Turhan B, Biffl S. Welcome from the ESEM 2017 general chair and program co-chairs. In Turhan B, Biffl S, editors, 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: 9-10 November 2017 Markham, Ontario, Canada. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2017. p. xii. (International Symposium on Empirical Software Engineering and Measurement). https://doi.org/10.1109/ESEM.2017.5