Virtual instrumentation based IC parametric tester for engineering education

Loren Nolan; Moi Tin Chew; Serge Demidenko; Po-Leen Ooi

doi:10.1109/DELTA.2010.71

Virtual instrumentation based IC parametric tester for engineering education

Loren Nolan, Moi Tin Chew, Serge Demidenko, Po-Leen Ooi

Malaysia School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010)
Editors	Ta Cao Minh
Place of Publication	CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	310 - 315
Number of pages	6
ISBN (Print)	9780769539782
DOIs	https://doi.org/10.1109/DELTA.2010.71
Publication status	Published - 2010
Event	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010 - Ho Chi Minh City, Vietnam Duration: 13 Jan 2010 → 15 Jan 2010 Conference number: 5th https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Proceedings)

Conference

Conference	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010
Abbreviated title	DELTA 2010
Country/Territory	Vietnam
City	Ho Chi Minh City
Period	13/01/10 → 15/01/10
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Proceedings)

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10.1109/DELTA.2010.71

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Nolan, L., Chew, M. T., Demidenko, S., & Ooi, P.-L. (2010). Virtual instrumentation based IC parametric tester for engineering education. In T. C. Minh (Ed.), Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010) (pp. 310 - 315). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DELTA.2010.71

@inproceedings{a37caa5d8927440eb3966460f685afd5,

title = "Virtual instrumentation based IC parametric tester for engineering education",

author = "Loren Nolan and Chew, {Moi Tin} and Serge Demidenko and Po-Leen Ooi",

year = "2010",

doi = "10.1109/DELTA.2010.71",

language = "English",

isbn = "9780769539782",

pages = "310 -- 315",

editor = "Minh, {Ta Cao}",

booktitle = "Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010, DELTA 2010 ; Conference date: 13-01-2010 Through 15-01-2010",

url = "https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding",

}

Nolan, L, Chew, MT, Demidenko, S & Ooi, P-L 2010, Virtual instrumentation based IC parametric tester for engineering education. in TC Minh (ed.), Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010). IEEE, Institute of Electrical and Electronics Engineers, CA USA, pp. 310 - 315, IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010, Ho Chi Minh City, Vietnam, 13/01/10. https://doi.org/10.1109/DELTA.2010.71

Virtual instrumentation based IC parametric tester for engineering education. / Nolan, Loren; Chew, Moi Tin; Demidenko, Serge et al.
Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010). ed. / Ta Cao Minh. CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2010. p. 310 - 315.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Virtual instrumentation based IC parametric tester for engineering education

AU - Nolan, Loren

AU - Chew, Moi Tin

AU - Demidenko, Serge

AU - Ooi, Po-Leen

N1 - Conference code: 5th

PY - 2010

Y1 - 2010

UR - http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5438527

U2 - 10.1109/DELTA.2010.71

DO - 10.1109/DELTA.2010.71

M3 - Conference Paper

SN - 9780769539782

SP - 310

EP - 315

BT - Proceedings Fifth IEEE International Symposium on Electronic Design, Test and Applications (DELTA 2010)

A2 - Minh, Ta Cao

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - CA USA

T2 - IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010

Y2 - 13 January 2010 through 15 January 2010

ER -

Virtual instrumentation based IC parametric tester for engineering education

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