Vertical Dispersion Johann X-ray Spectrometer with Asymmetrically cut Crystal

O Renner, Sergey Podorov, O Wehrhan, E Forster

    Research output: Contribution to journalArticleResearchpeer-review

    5 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)4569 - 4577
    Number of pages9
    JournalReview of Scientific Instruments
    Volume75
    Issue number11
    Publication statusPublished - 2004

    Cite this

    Renner, O., Podorov, S., Wehrhan, O., & Forster, E. (2004). Vertical Dispersion Johann X-ray Spectrometer with Asymmetrically cut Crystal. Review of Scientific Instruments, 75(11), 4569 - 4577.