Abstract
Metal halide perovskites (MHPs) have emerged as promising emitters because of their excellent optoelectronic properties, including high photoluminescence quantum yields (PLQYs), wide-range color tunability, and high color purity. However, a fundamental limitation of MHPs is their low exciton binding energy, which results in a low radiative recombination rate and the dependence of PLQY on the excitation intensity. Under the operating conditions of light-emitting diodes (LEDs), the injected current densities are typically lower than the trap density, leading to a low actual PLQY. Moreover, the defects not only initiate the decomposition of MHPs caused by extrinsic factors, but also intrinsically stimulate ion migration across the interface and lead to the corrosion of electrodes due to interaction between those electrodes, even under inert conditions. The passivation of defects has proven to be effective for mitigating the effects of defects in MHPs. Herein, the origins and theoretical calculations of the defect tolerance in MHPs and the impact of defects on both the performance and stability of perovskite LEDs are reviewed. The passivation methods and materials for MHP bulk films and nanocrystals are discussed in detail. Based on the currently reported advances, specific requirements and future research directions for display applications are suggested.
| Original language | English |
|---|---|
| Article number | 1805244 |
| Number of pages | 17 |
| Journal | Advanced Materials |
| Volume | 31 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - May 2019 |
| Externally published | Yes |
Keywords
- defects
- light-emitting diodes
- metal halide perovskites
- passivation
Cite this
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Versatile defect passivation methods for metal halide perovskite materials and their application to light-emitting devices. / Lee, Seungjin; Kim, Da Bin; Yu, Jae Choul; Jang, Chung Hyeon; Park, Jong Hyun; Lee, Bo Ram; Song, Myoung Hoon.
In: Advanced Materials, Vol. 31, No. 20, 1805244, 05.2019.Research output: Contribution to journal › Review Article › Other › peer-review
TY - JOUR
T1 - Versatile defect passivation methods for metal halide perovskite materials and their application to light-emitting devices
AU - Lee, Seungjin
AU - Kim, Da Bin
AU - Yu, Jae Choul
AU - Jang, Chung Hyeon
AU - Park, Jong Hyun
AU - Lee, Bo Ram
AU - Song, Myoung Hoon
PY - 2019/5
Y1 - 2019/5
N2 - Metal halide perovskites (MHPs) have emerged as promising emitters because of their excellent optoelectronic properties, including high photoluminescence quantum yields (PLQYs), wide-range color tunability, and high color purity. However, a fundamental limitation of MHPs is their low exciton binding energy, which results in a low radiative recombination rate and the dependence of PLQY on the excitation intensity. Under the operating conditions of light-emitting diodes (LEDs), the injected current densities are typically lower than the trap density, leading to a low actual PLQY. Moreover, the defects not only initiate the decomposition of MHPs caused by extrinsic factors, but also intrinsically stimulate ion migration across the interface and lead to the corrosion of electrodes due to interaction between those electrodes, even under inert conditions. The passivation of defects has proven to be effective for mitigating the effects of defects in MHPs. Herein, the origins and theoretical calculations of the defect tolerance in MHPs and the impact of defects on both the performance and stability of perovskite LEDs are reviewed. The passivation methods and materials for MHP bulk films and nanocrystals are discussed in detail. Based on the currently reported advances, specific requirements and future research directions for display applications are suggested.
AB - Metal halide perovskites (MHPs) have emerged as promising emitters because of their excellent optoelectronic properties, including high photoluminescence quantum yields (PLQYs), wide-range color tunability, and high color purity. However, a fundamental limitation of MHPs is their low exciton binding energy, which results in a low radiative recombination rate and the dependence of PLQY on the excitation intensity. Under the operating conditions of light-emitting diodes (LEDs), the injected current densities are typically lower than the trap density, leading to a low actual PLQY. Moreover, the defects not only initiate the decomposition of MHPs caused by extrinsic factors, but also intrinsically stimulate ion migration across the interface and lead to the corrosion of electrodes due to interaction between those electrodes, even under inert conditions. The passivation of defects has proven to be effective for mitigating the effects of defects in MHPs. Herein, the origins and theoretical calculations of the defect tolerance in MHPs and the impact of defects on both the performance and stability of perovskite LEDs are reviewed. The passivation methods and materials for MHP bulk films and nanocrystals are discussed in detail. Based on the currently reported advances, specific requirements and future research directions for display applications are suggested.
KW - defects
KW - light-emitting diodes
KW - metal halide perovskites
KW - passivation
UR - http://www.scopus.com/inward/record.url?scp=85060326950&partnerID=8YFLogxK
U2 - 10.1002/adma.201805244
DO - 10.1002/adma.201805244
M3 - Review Article
VL - 31
JO - Advanced Materials
JF - Advanced Materials
SN - 0935-9648
IS - 20
M1 - 1805244
ER -