Verification of trace length and trace impedance of fabricated load board using TDR

Low Sew Ming, Michael Phoon, Abu Suffian, J Johan

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)
    EditorsTanay Karnik
    Place of PublicationNew Jersey USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages401 - 404
    Number of pages4
    Volume1
    ISBN (Print)9781424449521
    Publication statusPublished - 2009
    EventAsia Symposium on Quality Electronic Design (ASQED) - Kuala Lumpur Malaysia, New Jersey USA
    Duration: 1 Jan 2009 → …

    Conference

    ConferenceAsia Symposium on Quality Electronic Design (ASQED)
    CityNew Jersey USA
    Period1/01/09 → …

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