Verification of trace length and trace impedance of fabricated load board using TDR

Low Sew Ming; Michael Phoon; Abu Suffian; J Johan

Verification of trace length and trace impedance of fabricated load board using TDR

Low Sew Ming, Michael Phoon, Abu Suffian, J Johan

Malaysia School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)
Editors	Tanay Karnik
Place of Publication	New Jersey USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	401 - 404
Number of pages	4
Volume	1
ISBN (Print)	9781424449521
Publication status	Published - 2009
Event	Asia Symposium on Quality Electronic Design (ASQED) 2009 - Kuala Lumpur Malaysia, New Jersey USA Duration: 1 Jan 2009 → …

Conference

Conference	Asia Symposium on Quality Electronic Design (ASQED) 2009
City	New Jersey USA
Period	1/01/09 → …

Cite this

@inproceedings{98266cc16299435f9327837a3ee1826d,

title = "Verification of trace length and trace impedance of fabricated load board using TDR",

author = "Ming, {Low Sew} and Michael Phoon and Abu Suffian and J Johan",

year = "2009",

language = "English",

isbn = "9781424449521",

volume = "1",

pages = "401 -- 404",

editor = "Tanay Karnik",

booktitle = "Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Asia Symposium on Quality Electronic Design (ASQED) 2009 ; Conference date: 01-01-2009",

}

Ming, LS, Phoon, M, Suffian, A & Johan, J 2009, Verification of trace length and trace impedance of fabricated load board using TDR. in T Karnik (ed.), Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009). vol. 1, IEEE, Institute of Electrical and Electronics Engineers, New Jersey USA, pp. 401 - 404, Asia Symposium on Quality Electronic Design (ASQED) 2009, New Jersey USA, 1/01/09.

Verification of trace length and trace impedance of fabricated load board using TDR. / Ming, Low Sew; Phoon, Michael; Suffian, Abu et al.
Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009). ed. / Tanay Karnik. Vol. 1 New Jersey USA: IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 401 - 404.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Verification of trace length and trace impedance of fabricated load board using TDR

AU - Ming, Low Sew

AU - Phoon, Michael

AU - Suffian, Abu

AU - Johan, J

PY - 2009

Y1 - 2009

M3 - Conference Paper

SN - 9781424449521

VL - 1

SP - 401

EP - 404

BT - Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)

A2 - Karnik, Tanay

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New Jersey USA

T2 - Asia Symposium on Quality Electronic Design (ASQED) 2009

Y2 - 1 January 2009

ER -