Using rapid-scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude

J. Möser, K. Lips, M. Tseytlin, G. R. Eaton, S. S. Eaton, A. Schnegg

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9 Citations (Scopus)

Abstract

X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.

Original languageEnglish
Pages (from-to)17-25
Number of pages9
JournalJournal of Magnetic Resonance
Volume281
DOIs
Publication statusPublished - 1 Aug 2017
Externally publishedYes

Keywords

  • Amorphous silicon
  • Quantitative EPR
  • Rapid-scan EPR
  • Sensitivity

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