Uses of a STEM Cs-corrector in electron diffractive imaging

Christian Dwyer, Peter Hartel, Heiko Muller, Maximilian Haider, Angus I Kirkland

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	958 - 959
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	13
Issue number	supp 2
Publication status	Published - 2007
Externally published	Yes

Cite this

@article{8ac61e3685784cf18981da0a50b32808,

title = "Uses of a STEM Cs-corrector in electron diffractive imaging",

author = "Christian Dwyer and Peter Hartel and Heiko Muller and Maximilian Haider and Kirkland, \{Angus I\}",

year = "2007",

language = "English",

volume = "13",

pages = "958 -- 959",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "supp 2",

}