Uses of a STEM Cs-corrector in electron diffractive imaging

Christian Dwyer, Peter Hartel, Heiko Muller, Maximilian Haider, Angus I Kirkland

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)958 - 959
Number of pages2
JournalMicroscopy and Microanalysis
Volume13
Issue numbersupp 2
Publication statusPublished - 2007
Externally publishedYes

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