Ultra wide band response of partial discharge test circuit

Tadeusz Czaszejko, Shi Chen

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of 2010 International Conference on High Voltage Engineering and Application
EditorsStanislaw Grzybowski, Z C Guan
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages61 - 64
Number of pages4
ISBN (Print)9781424482832
DOIs
Publication statusPublished - 2010
EventInternational Conference on High Voltage Engineering and Application (ICHVE) - New Orleans LA USA, USA
Duration: 1 Jan 2010 → …

Conference

ConferenceInternational Conference on High Voltage Engineering and Application (ICHVE)
CityUSA
Period1/01/10 → …

Cite this

Czaszejko, T., & Chen, S. (2010). Ultra wide band response of partial discharge test circuit. In S. Grzybowski, & Z. C. Guan (Eds.), Proceedings of 2010 International Conference on High Voltage Engineering and Application (pp. 61 - 64). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICHVE.2010.5640866