Ultra wide band response of partial discharge test circuit

Tadeusz Czaszejko; Shi Chen

doi:10.1109/ICHVE.2010.5640866

Ultra wide band response of partial discharge test circuit

Tadeusz Czaszejko, Shi Chen

Electrical and Computer Systems Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of 2010 International Conference on High Voltage Engineering and Application
Editors	Stanislaw Grzybowski, Z C Guan
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	61 - 64
Number of pages	4
ISBN (Print)	9781424482832
DOIs	https://doi.org/10.1109/ICHVE.2010.5640866
Publication status	Published - 2010
Event	International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans LA USA, USA Duration: 1 Jan 2010 → …

Conference

Conference	International Conference on High Voltage Engineering and Application (ICHVE)
City	USA
Period	1/01/10 → …

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10.1109/ICHVE.2010.5640866

Cite this

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title = "Ultra wide band response of partial discharge test circuit",

author = "Tadeusz Czaszejko and Shi Chen",

year = "2010",

doi = "10.1109/ICHVE.2010.5640866",

language = "English",

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pages = "61 -- 64",

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booktitle = "Proceedings of 2010 International Conference on High Voltage Engineering and Application",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "International Conference on High Voltage Engineering and Application (ICHVE) ; Conference date: 01-01-2010",

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Czaszejko, T & Chen, S 2010, Ultra wide band response of partial discharge test circuit. in S Grzybowski & ZC Guan (eds), Proceedings of 2010 International Conference on High Voltage Engineering and Application. IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 61 - 64, International Conference on High Voltage Engineering and Application (ICHVE), USA, 1/01/10. https://doi.org/10.1109/ICHVE.2010.5640866

Ultra wide band response of partial discharge test circuit. / Czaszejko, Tadeusz; Chen, Shi.
Proceedings of 2010 International Conference on High Voltage Engineering and Application. ed. / Stanislaw Grzybowski; Z C Guan. USA: IEEE, Institute of Electrical and Electronics Engineers, 2010. p. 61 - 64.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Ultra wide band response of partial discharge test circuit

AU - Czaszejko, Tadeusz

AU - Chen, Shi

PY - 2010

Y1 - 2010

UR - http://ieeexplore.ieee.org.ezproxy.lib.monash.edu.au/stamp/stamp.jsp?tp=&arnumber=5640866

U2 - 10.1109/ICHVE.2010.5640866

DO - 10.1109/ICHVE.2010.5640866

M3 - Conference Paper

SN - 9781424482832

SP - 61

EP - 64

BT - Proceedings of 2010 International Conference on High Voltage Engineering and Application

A2 - Grzybowski, Stanislaw

A2 - Guan, Z C

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - International Conference on High Voltage Engineering and Application (ICHVE)

Y2 - 1 January 2010

ER -

Ultra wide band response of partial discharge test circuit

Conference

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