Abstract
X-ray microscopy based on Fresnel zone plates is a powerful technique for sub-100 nm resolution imaging of biological and inorganic materials. Here, we report on the modeling, fabrication and characterization of zone-doubled Fresnel zone plates for the multi-keV regime (4"12 keV). We demonstrate unprecedented spatial resolution by resolving 15 nm lines and spaces in scanning transmission X-ray microscopy, and focusing diffraction efficiencies of 7.5% at 6.2 keV photon energy. These developments represent a significant step towards 10 nm spatial resolution for hard X-ray energies of up to 12 keV.
Original language | English |
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Pages (from-to) | 175-184 |
Number of pages | 10 |
Journal | Optics Express |
Volume | 19 |
Issue number | 1 |
DOIs | |
Publication status | Published - 3 Jan 2011 |
Externally published | Yes |