Abstract
The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in Bi0.5Sr0.5MnO3 using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.
| Original language | English |
|---|---|
| Pages (from-to) | 086102-1 - 086102-4 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 99 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2007 |
| Externally published | Yes |