Abstract
Differential interference contrast (DIC) microscopy is an inherently qualitative phase-imaging technique. What is obtained is an image with mixed phase-gradient and amplitude information rather than a true linear mapping of actual optical path length (OPL) differences. Here we investigate an approach that combines the transport-of-intensity equation (TIE) with DIC microscopy, thus improving direct visual observation. There is little hardware modification and the computation is noniterative. Numerically solving for the propagation of light in a series of through-focus DIC images allows linear phase information in a single slice to be completely determined and restored from DIC intensity values
| Original language | English |
|---|---|
| Pages (from-to) | 447-449 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 35 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Feb 2010 |
| Externally published | Yes |