Transmission electron microscopy without aberrations: Applications to materials science

Angus I Kirkland, Lan-Yun Chang, Sarah Haigh, Crispin J D Hetherington

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@article{a290502c588d409f99b8a7e69c45f18c,

title = "Transmission electron microscopy without aberrations: Applications to materials science",

author = "Kirkland, {Angus I} and Lan-Yun Chang and Sarah Haigh and Hetherington, {Crispin J D}",

year = "2008",

doi = "10.1016/j.cap.2007.10.065",

language = "English",

volume = "8",

pages = "425 -- 428",

journal = "Current Applied Physics",

issn = "1567-1739",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Transmission electron microscopy without aberrations: Applications to materials science

AU - Kirkland, Angus I

AU - Chang, Lan-Yun

AU - Haigh, Sarah

AU - Hetherington, Crispin J D

PY - 2008

Y1 - 2008

UR - http://www.sciencedirect.com/science/article/pii/S1567173907002246

U2 - 10.1016/j.cap.2007.10.065

DO - 10.1016/j.cap.2007.10.065

M3 - Article

SN - 1567-1739

VL - 8

SP - 425

EP - 428

JO - Current Applied Physics

JF - Current Applied Physics

IS - 3-4

ER -