Towards in situ x-ray diffraction imaging at the nanometer scale

Nadia Zatsepin, Rouben Dilanian, Andrei Yurievich Nikulin, Brian Mathew Gable, Barrington Charles Muddle, Osami Sakata

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of SPIE
EditorsMichael T Postek, John A Allgair
Place of PublicationUSA
PublisherSPIE
Pages70420F-1 - 70420F-10
Number of pages10
Volume7042
ISBN (Print)0277-786X
Publication statusPublished - 2008
EventSPIE Optics and Photonics 2008 - San Diego CA USA, USA
Duration: 1 Jan 2008 → …

Conference

ConferenceSPIE Optics and Photonics 2008
CityUSA
Period1/01/08 → …

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