| Original language | English |
|---|---|
| Pages (from-to) | 637 - 647 |
| Number of pages | 11 |
| Journal | Comptes Rendus Physique |
| Volume | 12 |
| Issue number | 7 |
| Publication status | Published - 2011 |
Towards a nanorisk appraisal framework
Rye Senjen, Steffen Hansen
Research output: Contribution to journal › Article › Research › peer-review
16
Citations
(Scopus)