Abstract
Defect prediction models are used to pinpoint risky software modules and understand past pitfalls that lead to defective modules. The predictions and insights that are derived from defect prediction models may not be accurate and reliable if researchers do not consider the impact of experimental components (e.g., datasets, metrics, and classifiers) of defect prediction modelling. Therefore, a lack of awareness and practical guidelines from previous research can lead to invalid predictions and unreliable insights. In this thesis, we investigate the impact that experimental components have on the predictions and insights of defect prediction models. Through case studies of systems that span both proprietary and open-source domains, we find that (1) noise in defect datasets; (2) parameter settings of classification techniques; and (3) model validation techniques have a large impact on the predictions and insights of defect prediction models, suggesting that researchers should carefully select experimental components in order to produce more accurate and reliable defect prediction models.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2016 IEEE/ACM 38th IEEE International Conference on Software Engineering Companion, ICSE 2016 |
| Subtitle of host publication | 14-22 May 2016 Austin, Texas, USA |
| Editors | Willem Visser, Laurie Williams |
| Place of Publication | New York NY USA |
| Publisher | IEEE, Institute of Electrical and Electronics Engineers |
| Pages | 867-870 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781450341615, 9781450342056 |
| DOIs | |
| Publication status | Published - 2016 |
| Externally published | Yes |
| Event | Doctoral Symposium of International Conference on Software Engineering 2016 - Austin, United States of America Duration: 18 May 2016 → 18 May 2016 |
Conference
| Conference | Doctoral Symposium of International Conference on Software Engineering 2016 |
|---|---|
| Country/Territory | United States of America |
| City | Austin |
| Period | 18/05/16 → 18/05/16 |
Keywords
- Defect prediction modelling
- Experimental components
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