Abstract
Multilayers of a titanyl oxalate complex with n‐octadecylamine were picked up onto quartz substrates by the Langmuir–Blodgett technique. X‐ray photoemission was used to detect the various species in the film and their relative concentrations. A Tougaard background deconvolution analysis of the photoelectron spectra was performed using the differential inelastic scattering cross‐section determined from reflection electron energy‐loss spectroscopy. By contrast with previous work on layer‐structured arachidate films, this analysis indicated that the various elements in the film were present with homogenous depth distributions. This is consistent with XPS take‐off angle studies and with x‐ray diffraction and electron microscopy studies, which showed the film to be amorphous. The composition of the film was determined to be TiO6.7C49N1.7, in reasonable agreement with the expected composition of TiO9C40N2.
| Original language | English |
|---|---|
| Pages (from-to) | 815-820 |
| Number of pages | 6 |
| Journal | Surface and Interface Analysis |
| Volume | 20 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Sept 1993 |
| Externally published | Yes |
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