Tolerance towards sensor failures: an application to a double inverted pendulum

Kok Yew Ng; Chee Pin Tan; Rini Akmeliawati

Tolerance towards sensor failures: an application to a double inverted pendulum

Kok Yew Ng, Chee Pin Tan, Rini Akmeliawati

Malaysia School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Third IEEE International Workshop on Electronic Design, Test and Applications
Editors	P Girard, A Osseiran, M Chew
Place of Publication	Piscastaway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	429 - 434
Number of pages	6
ISBN (Print)	0-7695-2500-8
Publication status	Published - 2006
Event	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2006 - Selangor, Malaysia, Selangor, Malaysia Duration: 17 Jan 2006 → 19 Jan 2006 Conference number: 3rd https://ieeexplore.ieee.org/xpl/conhome/10553/proceeding (Proceedings)

Conference

Conference	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2006
Abbreviated title	DELTA 2006
Country/Territory	Malaysia
City	Selangor
Period	17/01/06 → 19/01/06
Internet address	https://ieeexplore.ieee.org/xpl/conhome/10553/proceeding (Proceedings)

Cite this

@inproceedings{8c452e1b3f5f4f5680cd7bb7d3166b1a,

title = "Tolerance towards sensor failures: an application to a double inverted pendulum",

author = "Ng, {Kok Yew} and Tan, {Chee Pin} and Rini Akmeliawati",

year = "2006",

language = "English",

isbn = "0-7695-2500-8",

pages = "429 -- 434",

editor = "P Girard and A Osseiran and M Chew",

booktitle = "Third IEEE International Workshop on Electronic Design, Test and Applications",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2006, DELTA 2006 ; Conference date: 17-01-2006 Through 19-01-2006",

url = "https://ieeexplore.ieee.org/xpl/conhome/10553/proceeding",

}

Ng, KY, Tan, CP & Akmeliawati, R 2006, Tolerance towards sensor failures: an application to a double inverted pendulum. in P Girard, A Osseiran & M Chew (eds), Third IEEE International Workshop on Electronic Design, Test and Applications. IEEE, Institute of Electrical and Electronics Engineers, Piscastaway NJ USA, pp. 429 - 434, IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2006, Selangor, Malaysia, 17/01/06.

Tolerance towards sensor failures: an application to a double inverted pendulum. / Ng, Kok Yew; Tan, Chee Pin; Akmeliawati, Rini.
Third IEEE International Workshop on Electronic Design, Test and Applications. ed. / P Girard; A Osseiran; M Chew. Piscastaway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 429 - 434.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Tolerance towards sensor failures: an application to a double inverted pendulum

AU - Ng, Kok Yew

AU - Tan, Chee Pin

AU - Akmeliawati, Rini

N1 - Conference code: 3rd

PY - 2006

Y1 - 2006

M3 - Conference Paper

SN - 0-7695-2500-8

SP - 429

EP - 434

BT - Third IEEE International Workshop on Electronic Design, Test and Applications

A2 - Girard, P

A2 - Osseiran, A

A2 - Chew, M

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscastaway NJ USA

T2 - IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2006

Y2 - 17 January 2006 through 19 January 2006

ER -