Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy

E Cosgriff, Adrian D'Alfonso, Leslie Allen, Scott Findlay, A Kirkland, Peter Nellist

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

1 Citation (Scopus)

Abstract

A reduction in the focal depth of field as a result of the installation of aberration correctors in scanning transmission electron microscopy, allows three-dimensional information to be retrieved by optical depth sectioning. A three-dimensional representation of the specimen is achieved by recording a series of images over a range of focal values. Optical depth sectioning in zone-axis crystals is explored computationally using a Bloch wave analysis to explain the form of the electron intensity in the crystal as a function of depth. We find that the intensity maximum deviates from that of the expected defocus value due to pre-focusing by the atomic column and also due to channelling pendellosung.
Original languageEnglish
Title of host publicationJournal of Physics: Conference Series
EditorsPaul D Brown
Place of PublicationUK
PublisherIOP Publishing
Pages1 - 4
Number of pages4
Volume126
ISBN (Print)1742-6596
DOIs
Publication statusPublished - 2008
Externally publishedYes
EventInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2008 - Glasgow Scotland, Glasgow Scotland, United Kingdom
Duration: 1 Jan 2008 → …

Conference

ConferenceInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2008
Abbreviated titleEMAG 2008
CountryUnited Kingdom
CityGlasgow Scotland
Period1/01/08 → …

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