| Original language | English |
|---|---|
| Pages (from-to) | 125506-1 - 125506-4 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 99 |
| Issue number | 12 |
| Publication status | Published - 2007 |
Cite this
Nakashima, P. (2007). Thickness difference: a new filtering tool for quantitative electron diffraction. Physical Review Letters, 99(12), 125506-1 - 125506-4.
@article{630a5a60028540b5a62f05b380d57c58,
title = "Thickness difference: a new filtering tool for quantitative electron diffraction",
author = "Philip Nakashima",
year = "2007",
language = "English",
volume = "99",
pages = "125506--1 -- 125506--4",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "APS",
number = "12",
}
Nakashima, P 2007, 'Thickness difference: a new filtering tool for quantitative electron diffraction', Physical Review Letters, vol. 99, no. 12, pp. 125506-1 - 125506-4.
Thickness difference: a new filtering tool for quantitative electron diffraction. / Nakashima, Philip.
In: Physical Review Letters, Vol. 99, No. 12, 2007, p. 125506-1 - 125506-4.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Thickness difference: a new filtering tool for quantitative electron diffraction
AU - Nakashima, Philip
PY - 2007
Y1 - 2007
M3 - Article
VL - 99
SP - 125506-1 - 125506-4
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 12
ER -
Nakashima P. Thickness difference: a new filtering tool for quantitative electron diffraction. Physical Review Letters. 2007;99(12):125506-1 - 125506-4.