Thickness difference: a new filtering tool for quantitative electron diffraction

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)125506-1 - 125506-4
Number of pages4
JournalPhysical Review Letters
Volume99
Issue number12
Publication statusPublished - 2007

Cite this

@article{630a5a60028540b5a62f05b380d57c58,
title = "Thickness difference: a new filtering tool for quantitative electron diffraction",
author = "Philip Nakashima",
year = "2007",
language = "English",
volume = "99",
pages = "125506--1 -- 125506--4",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "APS",
number = "12",

}

Thickness difference: a new filtering tool for quantitative electron diffraction. / Nakashima, Philip.

In: Physical Review Letters, Vol. 99, No. 12, 2007, p. 125506-1 - 125506-4.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Thickness difference: a new filtering tool for quantitative electron diffraction

AU - Nakashima, Philip

PY - 2007

Y1 - 2007

M3 - Article

VL - 99

SP - 125506-1 - 125506-4

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 12

ER -