Thickness and growth-condition dependence of in-situ mobility and carrier density of epitaxial thin-film Bi2Se3

John Thery Hellerstedt, Mark Thomas Edmonds, Jianhao Chen, William G Cullen, Changxi Zheng, Michael Fuhrer

Research output: Contribution to journalArticleResearchpeer-review

14 Citations (Scopus)
Original languageEnglish
Pages (from-to)1 - 4
Number of pages4
JournalApplied Physics Letters
Volume105
Issue number17
DOIs
Publication statusPublished - 2014

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