Original language | English |
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Pages (from-to) | 1 - 4 |
Number of pages | 4 |
Journal | Applied Physics Letters |
Volume | 105 |
Issue number | 17 |
DOIs | |
Publication status | Published - 2014 |
Thickness and growth-condition dependence of in-situ mobility and carrier density of epitaxial thin-film Bi2Se3
John Thery Hellerstedt, Mark Thomas Edmonds, Jianhao Chen, William G Cullen, Changxi Zheng, Michael Fuhrer
Research output: Contribution to journal › Article › Research › peer-review
16
Citations
(Scopus)