Theory for annular bright field STEM imaging

S.D. Findlay, N. Shibata, Y. Ikuhara

Research output: Chapter in Book/Report/Conference proceedingChapter (Book)Researchpeer-review

2 Citations (Scopus)

Abstract

In this chapter, a basic theory of annular bright field (ABF) STEM is described using the so-called “s-state model” based on the channeling theory for dynamical electron diffraction. The effectiveness of this method for observing complex structures and dopant atoms in crystals was already explained in Sections 3.9.5 and 4.1.3.

Original languageEnglish
Title of host publicationScanning Transmission Electron Microscopy of Nanomaterials
Subtitle of host publicationBasics of Imaging and Analysis
EditorsNobuo Tanaka
Place of PublicationLondon UK
PublisherImperial College Press
Pages217-230
Number of pages14
ISBN (Electronic)9781848167902, 9781783264711
ISBN (Print)9781848167896
DOIs
Publication statusPublished - 30 Oct 2014

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