In this chapter, a basic theory of annular bright field (ABF) STEM is described using the so-called “s-state model” based on the channeling theory for dynamical electron diffraction. The effectiveness of this method for observing complex structures and dopant atoms in crystals was already explained in Sections 3.9.5 and 4.1.3.
|Title of host publication||Scanning Transmission Electron Microscopy of Nanomaterials|
|Subtitle of host publication||Basics of Imaging and Analysis|
|Place of Publication||London UK|
|Publisher||Imperial College Press|
|Number of pages||14|
|ISBN (Electronic)||9781848167902, 9781783264711|
|Publication status||Published - 30 Oct 2014|