| Original language | English |
|---|---|
| Pages (from-to) | 121 - 126 |
| Number of pages | 6 |
| Journal | European Physical Journal Special Topics |
| Volume | 167 |
| DOIs | |
| Publication status | Published - 2009 |
| Externally published | Yes |
The utility of resonant soft x-ray scattering and reflectivity for the nanoscale characterization of polymers
Sufal Swaraj, Cheng Wang, T Araki, Gary Mitchell, Lijun Liu, Scott Gaynor, Bala Deshmukh, H Yan, Christopher Robert McNeill, Harald Ade
Research output: Contribution to journal › Article › Research › peer-review
38
Citations
(Scopus)