Abstract
A widely used assignment scheme for Si 2p core-level photoemission studies of silicon oxidation relies solely on the formal oxidation state of the silicon. The tacit assumption of this assignment methodology is that second-neighbor effects have no measurable effect on observed Si 2p binding energies. In this letter, new experiments are combined with literature precedents to make the case that the second-neighbor effects play an important role in determining binding energy shifts.
| Original language | English |
|---|---|
| Pages (from-to) | 46-48 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 72 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Dec 1998 |
| Externally published | Yes |
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