Original language | English |
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Pages (from-to) | 2373 - 2378 |
Number of pages | 6 |
Journal | Journal of Physics D: Applied Physics |
Publication status | Published - 1997 |
The characterisation of SiGe/Si multilayers via an unambiguous solution of the inverse problem in x-ray Bragg diffraction
Andrei Yu Nikulin, P Zaumseil, P V Petrashen
Research output: Contribution to journal › Article › Research › peer-review