The characterisation of SiGe/Si multilayers via an unambiguous solution of the inverse problem in x-ray Bragg diffraction

Andrei Yu Nikulin, P Zaumseil, P V Petrashen

    Research output: Contribution to journalArticleResearchpeer-review

    Original languageEnglish
    Pages (from-to)2373 - 2378
    Number of pages6
    JournalJournal of Physics D: Applied Physics
    Publication statusPublished - 1997

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