Testing of pixellated CZT and CdTe detectors at the 200μm level

G. Jung, A. Berry, S. Midgley, G. Panjkovic

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2 Citations (Scopus)

Abstract

Cadmium Zinc Telluride (CZT) and Cadmium Telluride (CdTe) detectors with 200μ m pixellated electrodes were tested with the aim to determine material properties and electrical parameters for Hybrid Pixel Detector (HPD) systems. A 32 channel discrete analogue preamplifier platform was designed and manufactured in which radiation tests were performed on packaged detectors. Although simple in concept, numerous obstacles were encountered as a result of the bump bonding process. This paper provides an overview of HPD development at the Monash Centre for Synchrotron Science, details the tests performed on the current prototype detectors and illustrates the general methodologies used on the development pathway.

Original languageEnglish
Title of host publicationISIC-2009 - 12th International Symposium on Integrated Circuits, Proceedings
Pages187-190
Number of pages4
Publication statusPublished - 2009
Event12th International Symposium on Integrated Circuits - Singapore, Singapore
Duration: 14 Dec 200916 Dec 2009
Conference number: 12

Conference

Conference12th International Symposium on Integrated Circuits
CountrySingapore
CitySingapore
Period14/12/0916/12/09

Keywords

  • ASIC
  • CdTe
  • CZT
  • Pixel detector
  • X-ray

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