Abstract
Interferometry is increasingly used in transient phenomena studies. Temporal fringe pattern analysis is ideal for this form of study but necessitates large data storage. Current compression schemes do not facilitate efficient data retrieval and may even result in important data loss. Here, we describe an encoding scheme that results in low crucial data loss and performs temporal fringe analysis at the same time. From the encoded data, intensity fringe patterns and phase maps can be retrieved with ease. The scheme is demonstrated here with simulated wavefront interferometry temporal fringe patterns albeit it portends usage in other forms of fringe-based techniques as well.
Original language | English |
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Article number | 29 |
Pages (from-to) | 185-191 |
Number of pages | 7 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5852 PART I |
DOIs | |
Publication status | Published - 12 Dec 2005 |
Externally published | Yes |
Event | Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics - Singapore, Singapore Duration: 29 Nov 2004 → 1 Dec 2004 |
Keywords
- Compression
- Fringe analysis
- Interferometry
- Non-destructive testing
- Temporal processing