Tailoring the ratios between eigenfrequencies of tapping mode atomic force microscope probe using concentrated masses

Jiandong Cai, Michael Yu Wang, Qi Xia

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

Abstract

Higher harmonics signal in tapping mode atomic force microscope (AFM) topography imaging process is verified to be an evidence for material mapping in sample surface. Due to low amplitude and rapid decay of higher harmonics, structure design focused on cantilever probe is proposed to optimize the frequency response performance of probe. Here, we utilize concentrated masses to tune the ratio between eigenfrequencies for tip attached probe. Euler-Bernoulli beam theory is the fundamental for analysis. We figure out that adding masses can realize the tailoring of eigenfrequency ratios, and two concentrated masses will produce more frequency combination candidates than one concentrated mass. Probe with integer ratios between eigenfrequencies generates high sensitive responses at corresponding higher harmonics.

Original languageEnglish
Title of host publicationProceedings of the 2013 6th IEEE Conference on Robotics, Automation and Mechatronics, RAM 2013
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages207-211
Number of pages5
ISBN (Print)9781479911998
DOIs
Publication statusPublished - 2013
Externally publishedYes
EventIEEE Conference on Robotics, Automation and Mechatronics 2013 - https://ieeexplore.ieee.org/xpl/conhome/6747485/proceeding, Manila, Philippines
Duration: 12 Nov 201315 Nov 2013
Conference number: 6th

Publication series

NameIEEE Conference on Robotics, Automation and Mechatronics, RAM - Proceedings
ISSN (Print)2158-219X

Conference

ConferenceIEEE Conference on Robotics, Automation and Mechatronics 2013
Abbreviated titleRAM 2013
Country/TerritoryPhilippines
CityManila
Period12/11/1315/11/13

Keywords

  • cantilever probe
  • concentrated mass
  • eigenfrequency
  • higher harmonics
  • tapping mode atomic force microscope

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