Abstract
Higher harmonics signal in tapping mode atomic force microscope (AFM) topography imaging process is verified to be an evidence for material mapping in sample surface. Due to low amplitude and rapid decay of higher harmonics, structure design focused on cantilever probe is proposed to optimize the frequency response performance of probe. Here, we utilize concentrated masses to tune the ratio between eigenfrequencies for tip attached probe. Euler-Bernoulli beam theory is the fundamental for analysis. We figure out that adding masses can realize the tailoring of eigenfrequency ratios, and two concentrated masses will produce more frequency combination candidates than one concentrated mass. Probe with integer ratios between eigenfrequencies generates high sensitive responses at corresponding higher harmonics.
Original language | English |
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Title of host publication | Proceedings of the 2013 6th IEEE Conference on Robotics, Automation and Mechatronics, RAM 2013 |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 207-211 |
Number of pages | 5 |
ISBN (Print) | 9781479911998 |
DOIs | |
Publication status | Published - 2013 |
Externally published | Yes |
Event | IEEE Conference on Robotics, Automation and Mechatronics 2013 - https://ieeexplore.ieee.org/xpl/conhome/6747485/proceeding, Manila, Philippines Duration: 12 Nov 2013 → 15 Nov 2013 Conference number: 6th |
Publication series
Name | IEEE Conference on Robotics, Automation and Mechatronics, RAM - Proceedings |
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ISSN (Print) | 2158-219X |
Conference
Conference | IEEE Conference on Robotics, Automation and Mechatronics 2013 |
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Abbreviated title | RAM 2013 |
Country/Territory | Philippines |
City | Manila |
Period | 12/11/13 → 15/11/13 |
Keywords
- cantilever probe
- concentrated mass
- eigenfrequency
- higher harmonics
- tapping mode atomic force microscope