Abstract
Three new silicon/silicon oxide interfaces have been synthesized using the spherosiloxane clusters H8-Si8O12, H12Si12O18, H14Si14O21, and Si(100)-(2x1). The structure of the interfaces have been characterized by Si 2p core level photoemission spectroscopy. Reactions of H8Si8O12 with Si(111)-(7x7) and Ge(100)-(2x1) were also explored. The use of the cluster derived interfaces as spectroscopic models for thermal Si/SiO2 interfaces is discussed in terms of current methods for assigning photoemission spectra at solid/solid interfaces and the structural models proposed for the Si/SiO2 interface.
Original language | English |
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Pages (from-to) | 11819-11826 |
Number of pages | 8 |
Journal | Journal of the American Chemical Society |
Volume | 116 |
Issue number | 26 |
DOIs | |
Publication status | Published - 1 Dec 1994 |
Externally published | Yes |