Original language | English |
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Pages (from-to) | 533 - 536 |
Number of pages | 4 |
Journal | Surface Review and Letters |
Volume | 10 |
Issue number | 2 & 3 |
DOIs | |
Publication status | Published - 2003 |
Sulphur-passivated GaAs investigation using high resolution X-ray diffractometry
Konstantin Mikhailovitch Pavlov, Ian Maxwell Jamieson, Gregory Jakovidis, Anatoly Petrakov, Vasily I Punegov
Research output: Contribution to journal › Article › Research › peer-review