| Original language | English |
|---|---|
| Pages (from-to) | 479 - 493 |
| Number of pages | 15 |
| Journal | International Journal of Pattern Recognition and Artificial Intelligence |
| Volume | 19 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2005 |
Subspace-based face recognition: outlier detection and a new distance criterion
Pei Chen, David Suter
Research output: Contribution to journal › Article › Research › peer-review
2
Citations
(Scopus)