Original language | English |
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Pages (from-to) | 479 - 493 |
Number of pages | 15 |
Journal | International Journal of Pattern Recognition and Artificial Intelligence |
Volume | 19 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2005 |
Subspace-based face recognition: outlier detection and a new distance criterion
Pei Chen, David Suter
Research output: Contribution to journal › Article › Research › peer-review
2
Citations
(Scopus)