Subjective image quality assessment at the threshold level

C. White, R. Martin, D. Wu, C. S. Tan, D. M. Tan, H. R. Wu, J. Cai, Christopher White

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Abstract

    A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.

    Original languageEnglish
    Title of host publicationTENCON 2005 - 2005 IEEE Region 10 Conference
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    ISBN (Print)0780393112, 9780780393110
    DOIs
    Publication statusPublished - 2005
    EventIEEE Tencon (IEEE Region 10 Conference) 2005 - Crown Promenade Hotel, Melbourne, Australia
    Duration: 21 Nov 200524 Nov 2005
    https://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=10758

    Publication series

    NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
    Volume2007
    ISSN (Print)2159-3442
    ISSN (Electronic)2159-3450

    Conference

    ConferenceIEEE Tencon (IEEE Region 10 Conference) 2005
    CountryAustralia
    CityMelbourne
    Period21/11/0524/11/05
    Internet address

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