Subjective image quality assessment at the threshold level

C. White; R. Martin; D. Wu; C. S. Tan; D. M. Tan; H. R. Wu; J. Cai

doi:10.1109/TENCON.2005.300872

Subjective image quality assessment at the threshold level

C. White, R. Martin, D. Wu, C. S. Tan, D. M. Tan, H. R. Wu, J. Cai

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.

Original language	English
Title of host publication	TENCON 2005 - 2005 IEEE Region 10 Conference
Publisher	IEEE, Institute of Electrical and Electronics Engineers
ISBN (Print)	0780393112, 9780780393110
DOIs	https://doi.org/10.1109/TENCON.2005.300872
Publication status	Published - 2005
Event	IEEE Tencon (IEEE Region 10 Conference) 2005 - Crown Promenade Hotel, Melbourne, Australia Duration: 21 Nov 2005 → 24 Nov 2005 https://ieeexplore.ieee.org/xpl/conhome/4084859/proceeding (Proceedings)

Conference

Conference	IEEE Tencon (IEEE Region 10 Conference) 2005
Abbreviated title	TENCON 2005
Country/Territory	Australia
City	Melbourne
Period	21/11/05 → 24/11/05
Internet address	https://ieeexplore.ieee.org/xpl/conhome/4084859/proceeding (Proceedings)

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10.1109/TENCON.2005.300872

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title = "Subjective image quality assessment at the threshold level",

abstract = "A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.",

author = "C. White and R. Martin and D. Wu and Tan, {C. S.} and Tan, {D. M.} and Wu, {H. R.} and J. Cai",

year = "2005",

doi = "10.1109/TENCON.2005.300872",

language = "English",

isbn = "0780393112",

booktitle = "TENCON 2005 - 2005 IEEE Region 10 Conference",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE Tencon (IEEE Region 10 Conference) 2005, TENCON 2005 ; Conference date: 21-11-2005 Through 24-11-2005",

url = "https://ieeexplore.ieee.org/xpl/conhome/4084859/proceeding",

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TY - GEN

T1 - Subjective image quality assessment at the threshold level

AU - White, C.

AU - Martin, R.

AU - Wu, D.

AU - Tan, C. S.

AU - Tan, D. M.

AU - Wu, H. R.

AU - Cai, J.

PY - 2005

Y1 - 2005

N2 - A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.

AB - A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.

UR - http://www.scopus.com/inward/record.url?scp=34249309559&partnerID=8YFLogxK

U2 - 10.1109/TENCON.2005.300872

DO - 10.1109/TENCON.2005.300872

M3 - Conference Paper

SN - 0780393112

SN - 9780780393110

BT - TENCON 2005 - 2005 IEEE Region 10 Conference

PB - IEEE, Institute of Electrical and Electronics Engineers

T2 - IEEE Tencon (IEEE Region 10 Conference) 2005

Y2 - 21 November 2005 through 24 November 2005

ER -

Subjective image quality assessment at the threshold level

Abstract

Conference

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