TY - JOUR
T1 - Sub-micrometer charge modulation microscopy of a high mobility polymeric n-channel field-effect transistor
AU - Sciascia, Calogero
AU - Martino, Nicola
AU - Schuettfort, Torben
AU - Watts, Benjamin
AU - Grancini, Giulia
AU - Antognazza, Maria Rosa
AU - Zavelani-Rossi, Margherita
AU - McNeill, Christopher R.
AU - Caironi, Mario
PY - 2011/11/16
Y1 - 2011/11/16
N2 - Electro-optical mapping of the charge density with sub-micrometer resolution can be obtained in a high mobility, top-gate n-channel polymer field-effect transistor by charge modulation microscopy. Local features on the 1 μm scale are unveiled and, using scanning transmission X-ray microscopy measurements, are attributed to structural variations within the polymeric film.
AB - Electro-optical mapping of the charge density with sub-micrometer resolution can be obtained in a high mobility, top-gate n-channel polymer field-effect transistor by charge modulation microscopy. Local features on the 1 μm scale are unveiled and, using scanning transmission X-ray microscopy measurements, are attributed to structural variations within the polymeric film.
KW - charge transport
KW - organic electronics
KW - organic field-effect transistor
KW - organic semiconductors
KW - scanning transmission X-ray spectromicroscopy
UR - https://www.scopus.com/pages/publications/81255165561
U2 - 10.1002/adma.201102410
DO - 10.1002/adma.201102410
M3 - Article
C2 - 21989683
AN - SCOPUS:81255165561
SN - 0935-9648
VL - 23
SP - 5086
EP - 5090
JO - Advanced Materials
JF - Advanced Materials
IS - 43
ER -