Abstract
| Original language | English |
|---|---|
| Pages (from-to) | 1 - 4 |
| Number of pages | 4 |
| Journal | Applied Physics Letters |
| Volume | 100 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 2012 |
Cite this
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Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters. / Dwyer, Christian; Maunders, Christian; Zheng, Changlin; Weyland, Matthew; Tiemeijer, Peter; Etheridge, Joanne.
In: Applied Physics Letters, Vol. 100, No. 19, 2012, p. 1 - 4.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
AU - Dwyer, Christian
AU - Maunders, Christian
AU - Zheng, Changlin
AU - Weyland, Matthew
AU - Tiemeijer, Peter
AU - Etheridge, Joanne
PY - 2012
Y1 - 2012
N2 - Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEMimages using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM’s effective source distribution.
AB - Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEMimages using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM’s effective source distribution.
UR - http://apl.aip.org/resource/1/applab/v100/i19/p191915_s1
U2 - 10.1063/1.4711766
DO - 10.1063/1.4711766
M3 - Article
VL - 100
SP - 1
EP - 4
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 19
ER -