Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters

Christian Dwyer, Christian Maunders, Changlin Zheng, Matthew Weyland, Peter Tiemeijer, Joanne Etheridge

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Atomic-resolution imaging in the scanning transmission electron microscope (STEM) constitutes a powerful tool for nanostructure characterization. Here, we demonstrate the quantitative interpretation of atomic-resolution high-angle annular dark-field (ADF) STEMimages using an approach that does not rely on adjustable parameters. We measure independently the instrumental parameters that affect sub-0.1 nm-resolution ADF images, quantify their individual and collective contributions to the image intensity, and show that knowledge of these parameters enables a quantitative interpretation of the absolute intensity and contrast across all accessible spatial frequencies. The analysis also provides a method for the in-situ measurement of the STEM’s effective source distribution.
Original languageEnglish
Pages (from-to)1 - 4
Number of pages4
JournalApplied Physics Letters
Volume100
Issue number19
DOIs
Publication statusPublished - 2012

Cite this

Dwyer, Christian ; Maunders, Christian ; Zheng, Changlin ; Weyland, Matthew ; Tiemeijer, Peter ; Etheridge, Joanne. / Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters. In: Applied Physics Letters. 2012 ; Vol. 100, No. 19. pp. 1 - 4.
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Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters. / Dwyer, Christian; Maunders, Christian; Zheng, Changlin; Weyland, Matthew; Tiemeijer, Peter; Etheridge, Joanne.

In: Applied Physics Letters, Vol. 100, No. 19, 2012, p. 1 - 4.

Research output: Contribution to journalArticleResearchpeer-review

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