Structured database standardization framework for data mining of semiconductor manufacturing data

Ajay Achath Mohanan; Chris Chan; Melanie Ooi

Structured database standardization framework for data mining of semiconductor manufacturing data

Ajay Achath Mohanan, Chris Chan, Melanie Ooi

Malaysia Sch of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)
Editors	Tanay Karnik
Place of Publication	New Jersey USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	374 - 379
Number of pages	6
Volume	1
ISBN (Print)	9781424449521
Publication status	Published - 2009
Event	Asia Symposium on Quality Electronic Design (ASQED) 2009 - Kuala Lumpur Malaysia, New Jersey USA Duration: 1 Jan 2009 → …

Conference

Conference	Asia Symposium on Quality Electronic Design (ASQED) 2009
City	New Jersey USA
Period	1/01/09 → …

Cite this

@inproceedings{b4d19607ab79423889271c339d63faed,

title = "Structured database standardization framework for data mining of semiconductor manufacturing data",

author = "{Achath Mohanan}, Ajay and Chris Chan and Melanie Ooi",

year = "2009",

language = "English",

isbn = "9781424449521",

volume = "1",

pages = "374 -- 379",

editor = "Tanay Karnik",

booktitle = "Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Asia Symposium on Quality Electronic Design (ASQED) 2009 ; Conference date: 01-01-2009",

}

Achath Mohanan, A, Chan, C & Ooi, M 2009, Structured database standardization framework for data mining of semiconductor manufacturing data. in T Karnik (ed.), Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009). vol. 1, IEEE, Institute of Electrical and Electronics Engineers, New Jersey USA, pp. 374 - 379, Asia Symposium on Quality Electronic Design (ASQED) 2009, New Jersey USA, 1/01/09.

Structured database standardization framework for data mining of semiconductor manufacturing data. / Achath Mohanan, Ajay; Chan, Chris; Ooi, Melanie.

Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009). ed. / Tanay Karnik. Vol. 1 New Jersey USA : IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 374 - 379.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Structured database standardization framework for data mining of semiconductor manufacturing data

AU - Achath Mohanan, Ajay

AU - Chan, Chris

AU - Ooi, Melanie

PY - 2009

Y1 - 2009

M3 - Conference Paper

SN - 9781424449521

VL - 1

SP - 374

EP - 379

BT - Proceedings of the First Asia Symposium on Quality Electronic Design (ASQED 2009)

A2 - Karnik, Tanay

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New Jersey USA

T2 - Asia Symposium on Quality Electronic Design (ASQED) 2009

Y2 - 1 January 2009

ER -