Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe

Hamish Brown, Zhen Chen, Matthew Weyland, C. Ophus, Jim Ciston, L. J. Allen, Scott Findlay

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The projected electrostatic potential of a thick crystal is reconstructed at atomic resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast-readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin (≲50 Å) samples. Instruments already coming on line can overcome the remaining resolution-limiting effects in this method due to finite probe-forming aperture size, spatial incoherence, and residual lens aberrations.
Original languageEnglish
Article number266102
Number of pages6
JournalPhysical Review Letters
Issue number26
Publication statusPublished - 26 Dec 2018

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