Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)387 - 390
Number of pages4
JournalActa Crystallographica Section A
Volume63
Issue number5
Publication statusPublished - 2007

Cite this

@article{e78bd87972764d58803371b779e3bba9,
title = "Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns",
author = "Philip Nakashima and Moodie, {Alex F} and Joanne Etheridge",
year = "2007",
language = "English",
volume = "63",
pages = "387 -- 390",
journal = "Acta Crystallographica Section A",
issn = "0108-7673",
publisher = "International Union of Crystallography",
number = "5",

}

Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns. / Nakashima, Philip; Moodie, Alex F; Etheridge, Joanne.

In: Acta Crystallographica Section A, Vol. 63, No. 5, 2007, p. 387 - 390.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns

AU - Nakashima, Philip

AU - Moodie, Alex F

AU - Etheridge, Joanne

PY - 2007

Y1 - 2007

M3 - Article

VL - 63

SP - 387

EP - 390

JO - Acta Crystallographica Section A

JF - Acta Crystallographica Section A

SN - 0108-7673

IS - 5

ER -