Abstract
Learning unbiased models on imbalanced datasets is a significant challenge. Rare classes tend to get a concentrated representation in the classification space which hampers the generalization of learned boundaries to new test examples. In this paper, we demonstrate that the Bayesian uncertainty estimates directly correlate with the rarity of classes and the difficulty level of individual samples. Subsequently, we present a novel framework for uncertainty based class imbalance learning that follows two key insights: First, classification boundaries should be extended further away from a more uncertain (rare) class to avoid over-fitting and enhance its generalization. Second, each sample should be modeled as a multi-variate Gaussian distribution with a mean vector and a covariance matrix defined by the sample's uncertainty. The learned boundaries should respect not only the individual samples but also their distribution in the feature space. Our proposed approach efficiently utilizes sample and class uncertainty information to learn robust features and more generalizable classifiers. We systematically study the class imbalance problem and derive a novel loss formulation for max-margin learning based on Bayesian uncertainty measure. The proposed method shows significant performance improvements on six benchmark datasets for face verification, attribute prediction, digit/object classification and skin lesion detection.
Original language | English |
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Title of host publication | Proceedings - 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2019 |
Editors | Abhinav Gupta, Derek Hoiem, Gang Hua, Zhuowen Tu |
Place of Publication | Piscataway NJ USA |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 103-112 |
Number of pages | 10 |
ISBN (Electronic) | 9781728132938 |
ISBN (Print) | 9781728132945 |
DOIs | |
Publication status | Published - 2019 |
Externally published | Yes |
Event | IEEE Conference on Computer Vision and Pattern Recognition 2019 - Long Beach, United States of America Duration: 16 Jun 2019 → 20 Jun 2019 Conference number: 32nd http://cvpr2019.thecvf.com/ https://ieeexplore.ieee.org/xpl/conhome/8938205/proceeding (Proceedings) |
Publication series
Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
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Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Volume | 2019-June |
ISSN (Print) | 1063-6919 |
ISSN (Electronic) | 2575-7075 |
Conference
Conference | IEEE Conference on Computer Vision and Pattern Recognition 2019 |
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Abbreviated title | CVPR 2019 |
Country/Territory | United States of America |
City | Long Beach |
Period | 16/06/19 → 20/06/19 |
Internet address |
Keywords
- Deep Learning
- Low-level Vision