Abstract
| Original language | English |
|---|---|
| Title of host publication | Scanning transmission electron microscopy |
| Subtitle of host publication | Imaging and analysis |
| Editors | Stephen J. Pennycook, Peter D. Nellist |
| Place of Publication | New York, USA |
| Publisher | Springer |
| Pages | 353-392 |
| Number of pages | 40 |
| ISBN (Electronic) | 9781441972002 |
| ISBN (Print) | 9781441971999 |
| DOIs | |
| Publication status | Published - 2011 |
Cite this
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STEM Tomography. / Midgley, Paul A.; Weyland, Matthew.
Scanning transmission electron microscopy: Imaging and analysis. ed. / Stephen J. Pennycook; Peter D. Nellist. New York, USA : Springer, 2011. p. 353-392.Research output: Chapter in Book/Report/Conference proceeding › Chapter (Book) › Research › peer-review
TY - CHAP
T1 - STEM Tomography
AU - Midgley, Paul A.
AU - Weyland, Matthew
PY - 2011
Y1 - 2011
N2 - We discuss how electron tomography can be implemented using the STEM imaging mode and how 3D reconstructions can be obtained from nanoscale objects. The theory of tomographic reconstruction and how the STEM HAADF signal is ideal for tomographic acquisition are described. Practical issues are highlighted including the acquisition of tilt series, image alignment and choice of reconstruction algorithm. The visualisation and analysis of the reconstruction is also discussed. Problems and advantages specific to STEM tomography are highlighted and a number of examples of STEM tomography across the field of materials science are presented.
AB - We discuss how electron tomography can be implemented using the STEM imaging mode and how 3D reconstructions can be obtained from nanoscale objects. The theory of tomographic reconstruction and how the STEM HAADF signal is ideal for tomographic acquisition are described. Practical issues are highlighted including the acquisition of tilt series, image alignment and choice of reconstruction algorithm. The visualisation and analysis of the reconstruction is also discussed. Problems and advantages specific to STEM tomography are highlighted and a number of examples of STEM tomography across the field of materials science are presented.
U2 - 10.1007/978-1-4419-7200-2_8
DO - 10.1007/978-1-4419-7200-2_8
M3 - Chapter (Book)
SN - 9781441971999
SP - 353
EP - 392
BT - Scanning transmission electron microscopy
A2 - Pennycook, Stephen J.
A2 - Nellist, Peter D.
PB - Springer
CY - New York, USA
ER -