STEM Tomography

Paul A. Midgley, Matthew Weyland

Research output: Chapter in Book/Report/Conference proceedingChapter (Book)Researchpeer-review

Abstract

We discuss how electron tomography can be implemented using the STEM imaging mode and how 3D reconstructions can be obtained from nanoscale objects. The theory of tomographic reconstruction and how the STEM HAADF signal is ideal for tomographic acquisition are described. Practical issues are highlighted including the acquisition of tilt series, image alignment and choice of reconstruction algorithm. The visualisation and analysis of the reconstruction is also discussed. Problems and advantages specific to STEM tomography are highlighted and a number of examples of STEM tomography across the field of materials science are presented.
Original languageEnglish
Title of host publicationScanning transmission electron microscopy
Subtitle of host publicationImaging and analysis
EditorsStephen J. Pennycook, Peter D. Nellist
Place of PublicationNew York, USA
PublisherSpringer
Pages353-392
Number of pages40
ISBN (Electronic)9781441972002
ISBN (Print)9781441971999
DOIs
Publication statusPublished - 2011

Cite this

Midgley, P. A., & Weyland, M. (2011). STEM Tomography. In S. J. Pennycook, & P. D. Nellist (Eds.), Scanning transmission electron microscopy: Imaging and analysis (pp. 353-392). Springer. https://doi.org/10.1007/978-1-4419-7200-2_8