STEM electron tomography for nanoscale materials science

P. A. Midgley; M. Weyland; T. Yates; J. Tong; R. Dunin-Borkowski; John Meurig Thomas

doi:10.1017/S143192760488125X

STEM electron tomography for nanoscale materials science

P. A. Midgley, M. Weyland, T. Yates, J. Tong, R. Dunin-Borkowski, John Meurig Thomas

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	148-149
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S143192760488125X
Publication status	Published - 24 Sept 2004
Externally published	Yes

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@article{e0d7171c6f7a45fd9a92adbe1e50a704,

title = "STEM electron tomography for nanoscale materials science",

author = "Midgley, {P. A.} and M. Weyland and T. Yates and J. Tong and R. Dunin-Borkowski and Thomas, {John Meurig}",

year = "2004",

month = sep,

day = "24",

doi = "10.1017/S143192760488125X",

language = "English",

volume = "10",

pages = "148--149",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - STEM electron tomography for nanoscale materials science

AU - Midgley, P. A.

AU - Weyland, M.

AU - Yates, T.

AU - Tong, J.

AU - Dunin-Borkowski, R.

AU - Thomas, John Meurig

PY - 2004/9/24

Y1 - 2004/9/24

UR - http://www.scopus.com/inward/record.url?scp=4544302137&partnerID=8YFLogxK

U2 - 10.1017/S143192760488125X

DO - 10.1017/S143192760488125X

M3 - Meeting Abstract

AN - SCOPUS:4544302137

SN - 1431-9276

VL - 10

SP - 148

EP - 149

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

STEM electron tomography for nanoscale materials science

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