STEM electron tomography for nanoscale materials science

P. A. Midgley, M. Weyland, T. Yates, J. Tong, R. Dunin-Borkowski, John Meurig Thomas

Research output: Contribution to journalArticleOtherpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)148-149
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 24 Sep 2004
Externally publishedYes

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