Standardless atom counting in scanning transmission electron microscopy

James LeBeau; Scott Findlay; Leslie Allen; Susanne Stemmer

doi:10.1021/nl102025s

Standardless atom counting in scanning transmission electron microscopy

James LeBeau
, Scott Findlay
, Leslie Allen
, Susanne Stemmer

Research output: Contribution to journal › Article › Research › peer-review

214 Citations (Scopus)

Abstract

We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.

Original language	English
Pages (from-to)	4405 - 4408
Number of pages	4
Journal	Nano Letters
Volume	10
Issue number	11
DOIs	https://doi.org/10.1021/nl102025s
Publication status	Published - 2010
Externally published	Yes

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10.1021/nl102025s

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title = "Standardless atom counting in scanning transmission electron microscopy",

abstract = "We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.",

author = "James LeBeau and Scott Findlay and Leslie Allen and Susanne Stemmer",

year = "2010",

doi = "10.1021/nl102025s",

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T1 - Standardless atom counting in scanning transmission electron microscopy

AU - LeBeau, James

AU - Findlay, Scott

AU - Allen, Leslie

AU - Stemmer, Susanne

PY - 2010

Y1 - 2010

N2 - We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.

AB - We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.

UR - http://pubs.acs.org.ezproxy.lib.monash.edu.au/doi/pdf/10.1021/nl102025s

U2 - 10.1021/nl102025s

DO - 10.1021/nl102025s

M3 - Article

SN - 1530-6984

VL - 10

SP - 4405

EP - 4408

JO - Nano Letters

JF - Nano Letters

IS - 11

ER -

Standardless atom counting in scanning transmission electron microscopy

Abstract

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